Sep 15, 2024
Device malfunctions from continuous current lead to discovery that can improve design of microelectronic devices
Posted by Saúl Morales Rodriguéz in categories: computing, electronics
A new study led by researchers at the University of Minnesota Twin Cities is providing new insights into how next-generation electronics, including memory components in computers, break down or degrade over time. Understanding the reasons for degradation could help improve efficiency of data storage solutions.